unDrift: A versatile software for fast offline SPM image drift correction

• Tobias Dickbreder,
• Franziska Sabath,
• Lukas Höltkemeier,
• Ralf Bechstein and
• Angelika Kühnle

Beilstein J. Nanotechnol. 2023, 14, 1225–1237, doi:10.3762/bjnano.14.101

• literature, and there are several different strategies documented to determine the calibration parameters for a scanning probe microscope [1][2][3][7][8][9][12][18][19][21][22]. With these calibration parameters, the microscope can either be calibrated before the measurement, or the measured SPM data can be

Dual-heterodyne Kelvin probe force microscopy

• Benjamin Grévin,
• Fatima Husainy,
• Dmitry Aldakov and
• Cyril Aumaître

Beilstein J. Nanotechnol. 2023, 14, 1068–1084, doi:10.3762/bjnano.14.88

• ), driven by a Mimea scanning probe microscope (SPM) controller (SPECS-Nanonis). Topographic imaging is performed in FM mode (FM-AFM) in the attractive regime, with negative frequency shifts of a few Hz and vibration amplitudes of a few tens of nm. All experiments were performed with Pt/Ir coated silicon

High–low Kelvin probe force spectroscopy for measuring the interface state density

• Ryo Izumi,
• Masato Miyazaki,
• Yan Jun Li and
• Yasuhiro Sugawara

Beilstein J. Nanotechnol. 2023, 14, 175–189, doi:10.3762/bjnano.14.18

• Δf as a function of the DC bias voltage Vdc while keeping the distance between the tip and the sample constant. These experiments were performed in a vacuum environment using a JEOL scanning probe microscope (JEOL: JSPM-4210). A silicon substrate patterned with n- and p-type impurities was used as a

From a free electron gas to confined states: A mixed island of PTCDA and copper phthalocyanine on Ag(111)

• Alfred J. Weymouth,
• Emily Roche and
• Franz J. Giessibl

Beilstein J. Nanotechnol. 2022, 13, 1572–1577, doi:10.3762/bjnano.13.131

• Measurements were carried out in a He-bath scanning probe microscope (CreaTec Fischer & Co. GmbH) and were acquired in ultrahigh vacuum at 5.6 K. Ag(111) (Mateck GmbH) was prepared with standard sputter and anneal cycles. The PTCDA and CuPc were evaporated from a custom-built evaporator. A detailed description

Studies of probe tip materials by atomic force microscopy: a review

• Ke Xu and
• Yuzhe Liu

Beilstein J. Nanotechnol. 2022, 13, 1256–1267, doi:10.3762/bjnano.13.104

• the direction of new probes and further promotes the broader and deeper application of scanning probe microscope (SPM). Keywords: AFM; carbon nanotube probe; colloid probe; metal probe; Introduction AFM represents a well-established technique for the investigation of the nanosurface morphology

Two dynamic modes to streamline challenging atomic force microscopy measurements

• Alexei G. Temiryazev,
• Andrey V. Krayev and
• Marina P. Temiryazeva

Beilstein J. Nanotechnol. 2021, 12, 1226–1236, doi:10.3762/bjnano.12.90

• point. For high quality images, a correct feedback gain setting is required. We will not consider this issue in detail, since it is sufficiently general for all systems with negative feedback; the specificity associated with the operation of a scanning probe microscope can be found in [11]. We only note

Molecular assemblies on surfaces: towards physical and electronic decoupling of organic molecules

• Sabine Maier and
• Meike Stöhr

Beilstein J. Nanotechnol. 2021, 12, 950–956, doi:10.3762/bjnano.12.71

• tip of a scanning probe microscope and mechanically lifted from the metallic surface such that they hang freely between metal contacts. This manipulation technique allows for measuring, amongst others, the electronic conductance, magnetic properties, reversible switching, and electroluminescence of

High permittivity, breakdown strength, and energy storage density of polythiophene-encapsulated BaTiO₃ nanoparticles

• Adnanullah Khan,
• Amir Habib and
• Adeel Afzal

Beilstein J. Nanotechnol. 2020, 11, 1190–1197, doi:10.3762/bjnano.11.103

• microscopy (JEOL JSM 6490LA SEM) and atomic force microscopy (JSPM-5200 scanning probe microscope). Electrical properties of the bulk materials are measured under ambient conditions with a Wayne Kerr 6505B precision impedance analyzer and a Hipotronics HD103 3kV DC Hipot Tester. Results and Discussion

Implementation of data-cube pump–probe KPFM on organic solar cells

• Benjamin Grévin,
• Olivier Bardagot and
• Renaud Demadrille

Beilstein J. Nanotechnol. 2020, 11, 323–337, doi:10.3762/bjnano.11.24

• KPFM loop (VKPFM) as a function of the delay Δt between the probe and pump pulses. (b) Scheme (top middle and bottom left-middle) of the signal processing by the scanning probe microscope (SPM) controller, the LIA and the arbitrary waveform generator (AWG). The electrostatic forces are detected by

Nanosecond resistive switching in Ag/AgI/PtIr nanojunctions

• Botond Sánta,
• Dániel Molnár,
• Patrick Haiber,
• Agnes Gubicza,
• Edit Szilágyi,
• Zsolt Zolnai,
• András Halbritter and
• Miklós Csontos

Beilstein J. Nanotechnol. 2020, 11, 92–100, doi:10.3762/bjnano.11.9

• tip of a scanning probe microscope. We demonstrate stable resistive switching duty cycles and investigate the dynamical aspects of non-volatile operation in detail. The high-speed switching capabilities are explored by a custom-designed microwave setup that enables time-resolved studies of subsequent

Antimony deposition onto Au(111) and insertion of Mg

• Lingxing Zan,
• Da Xing,
• Abdelaziz Ali Abd-El-Latif and
• Helmut Baltruschat

Beilstein J. Nanotechnol. 2019, 10, 2541–2552, doi:10.3762/bjnano.10.245

• LabVIEW software (National Instruments GmbH, Munich, Germany) for recording the cyclic voltammograms (CVs). Electrochemical scanning tunneling microscopy (EC-STM) measurements All EC-STM measurements were performed with an Agilent Technologies 5500 scanning probe microscope (SPM) and a commercially

Tunable fractional Fourier transform implementation of electronic wave functions in atomically thin materials

• Daniela Dragoman

Beilstein J. Nanotechnol. 2018, 9, 1828–1833, doi:10.3762/bjnano.9.174

• the probability distribution of charge carriers can be obtained using a scanning probe microscope. These (x,y) mappings correspond to different values of α along the y direction, and thus implement the α-tunable Radon transform of the incident quantum wave functions, which is known to be able to

Multimodal noncontact atomic force microscopy and Kelvin probe force microscopy investigations of organolead tribromide perovskite single crystals

• Yann Almadori,
• David Moerman,
• Jaume Llacer Martinez,
• Philippe Leclère and
• Benjamin Grévin

Beilstein J. Nanotechnol. 2018, 9, 1695–1704, doi:10.3762/bjnano.9.161

• . Logic signals generated by the scanning probe microscope controller were used to trigger the generation of illumination pulse sequences by the AWG operated in “burst” mode. Spectroscopic data were acquired by simultaneously recording the temporal evolution of the surface potential (SP(t)) and the AFM

Tuning adhesion forces between functionalized gold colloidal nanoparticles and silicon AFM tips: role of ligands and capillary forces

• Sven Oras,
• Sergei Vlassov,
• Marta Berholts,
• Rünno Lõhmus and
• Karine Mougin

Beilstein J. Nanotechnol. 2018, 9, 660–670, doi:10.3762/bjnano.9.61

• , France Department of Physics and Astronomy, University of Turku, FIN-20014 Turku, Finland 10.3762/bjnano.9.61 Abstract Adhesion forces between functionalized gold colloidal nanoparticles (Au NPs) and scanning probe microscope silicon tips were experimentally investigated by atomic force microscopy (AFM

Blister formation during graphite surface oxidation by Hummers’ method

• Olga V. Sinitsyna,
• Georgy B. Meshkov,
• Anastasija V. Grigorieva,
• Alexander A. Antonov,
• Inna G. Grigorieva and
• Igor V. Yaminsky

Beilstein J. Nanotechnol. 2018, 9, 407–414, doi:10.3762/bjnano.9.40

• additional experiment was conducted in which the time of the treatment with the oxidation mixture was 3 minutes. Sample characterization AFM measurements were carried out using a FemtoScan multifunctional scanning probe microscope produced by the Advanced Technologies Center. The surface topography was

A robust AFM-based method for locally measuring the elasticity of samples

• Alexandre Bubendorf,
• Stefan Walheim,
• Thomas Schimmel and
• Ernst Meyer

Beilstein J. Nanotechnol. 2018, 9, 1–10, doi:10.3762/bjnano.9.1

• head from Nanosurf and the Nanonis scanning probe microscope controller. The system integrates the phase-locked loops (PLLs) necessary for tracking the contact resonances and all the controlling and signal generation modules for measuring and mapping the physical quantities. Square areas of 2.5 μm

Patterning of supported gold monolayers via chemical lift-off lithography

• Liane S. Slaughter,
• Kevin M. Cheung,
• Sami Kaappa,
• Huan H. Cao,
• Qing Yang,
• Thomas D. Young,
• Andrew C. Serino,
• Sami Malola,
• Jana M. Olson,
• Stephan Link,
• Hannu Häkkinen,
• Anne M. Andrews and
• Paul S. Weiss

Beilstein J. Nanotechnol. 2017, 8, 2648–2661, doi:10.3762/bjnano.8.265

• the PDMS before each sample was rinsed on both sides with ethanol and blown dry. Peak-force atomic force microscopy A Bruker Dimension Icon scanning probe microscope (Bruker Nano, Santa Barbara, CA, USA) was used to map the topography and mechanical properties of flat PDMS stamps patterned with Au

Measuring adhesion on rough surfaces using atomic force microscopy with a liquid probe

• Juan V. Escobar,
• Cristina Garza and
• Rolando Castillo

Beilstein J. Nanotechnol. 2017, 8, 813–825, doi:10.3762/bjnano.8.84

• ., Russia) intended for 3D visualization of scanning tips (Figure 1). The grating with the sharp peaks was inspected with standard Si3N4 SPM cantilevers in contact mode. The scans were obtained with a scanning probe microscope in vacuum (1 × 10−4 Pa). The inverted images of the tip (not presented in this

• work) represent the sum of the experimental cantilever tip radius-of-curvature and the sharpened grating sharp peak. AFM and force–displacement curves: Force–displacement curves were obtained with a scanning probe microscope (JSTM-4200 JEOL, Japan) with an 80 × 80 μm scanner that has an integrated

Dynamic of cold-atom tips in anharmonic potentials

• Tobias Menold,
• Peter Federsel,
• Carola Rogulj,
• Hendrik Hölscher,
• József Fortágh and
• Andreas Günther

Beilstein J. Nanotechnol. 2016, 7, 1543–1555, doi:10.3762/bjnano.7.148

• ultracold temperatures, the absorption of a single photon is sufficient to remove the corresponding atom from the tip. This was the main limitation in the first realization of a cold-atom scanning probe microscope [29], as new cold-atom tips could only be generated on timescales of about 60 s. The

• as that used for the first cold-atom scanning probe microscope [29][52]. It uses standard cooling and trapping techniques to generate cold-atom tips of 87Rb atoms in an ultrahigh vacuum environment [53]. The trapping and manipulation of the cold-atom tip is achieved via a magnetic microchip, holding

Large area scanning probe microscope in ultra-high vacuum demonstrated for electrostatic force measurements on high-voltage devices

• Urs Gysin,
• Thilo Glatzel,
• Thomas Schmölzer,
• Adolf Schöner,
• Sergey Reshanov,
• Holger Bartolf and
• Ernst Meyer

Beilstein J. Nanotechnol. 2015, 6, 2485–2497, doi:10.3762/bjnano.6.258

• damping of the sensor. Furthermore, UHV environment allows for the analysis of clean surfaces under controlled environmental conditions. Because of these requirements we built a large area scanning probe microscope operating under UHV conditions at room temperature allowing to perform various electrical

A scanning probe microscope for magnetoresistive cantilevers utilizing a nested scanner design for large-area scans

• Tobias Meier,
• Alexander Förste,
• Ali Tavassolizadeh,
• Karsten Rott,
• Dirk Meyners,
• Roland Gröger,
• Günter Reiss,
• Eckhard Quandt,
• Thomas Schimmel and
• Hendrik Hölscher

Beilstein J. Nanotechnol. 2015, 6, 451–461, doi:10.3762/bjnano.6.46

Functionalization of α-synuclein fibrils

• Simona Povilonienė,
• Vida Časaitė,
• Virginijus Bukauskas,
• Arūnas Šetkus,
• Juozas Staniulis and
• Rolandas Meškys

Beilstein J. Nanotechnol. 2015, 6, 124–133, doi:10.3762/bjnano.6.12

• the standard contact and tapping AFM modes by scanning probe microscope SPM D3100/Nanoscope IVa (Veeco, now Bruker). Two types of silicon tips, OTESPA and SNL (Bruker), were used. The images were processed by the Scanning Probe Image Processor, Version 5.1.0 software (Image Metrology, Denmark). The

Patterning a hydrogen-bonded molecular monolayer with a hand-controlled scanning probe microscope

• Matthew F. B. Green,
• Taner Esat,
• Christian Wagner,
• Philipp Leinen,
• Alexander Grötsch,
• F. Stefan Tautz and
• Ruslan Temirov

Beilstein J. Nanotechnol. 2014, 5, 1926–1932, doi:10.3762/bjnano.5.203

• molecular-scale functional design, which includes arranging molecules into complex structures at will. The first steps towards this goal were made through the invention of the scanning probe microscope (SPM), which put single-atom and single-molecule manipulation into practice for the first time. Extending

• ); Introduction The scanning probe microscope (SPM) is an excellent tool for the manipulation of atoms and molecules on surfaces due to its high spatial imaging resolution and atomic-scale precision [1][2][3][4][5][6][7]. Today, controlled SPM manipulation of individual atoms and small molecules is a routine

Organic and inorganic–organic thin film structures by molecular layer deposition: A review

• Pia Sundberg and
• Maarit Karppinen

Beilstein J. Nanotechnol. 2014, 5, 1104–1136, doi:10.3762/bjnano.5.123

• approximate length of the PMDA–ODA chain is 14.9 Å, none of the groups achieved GPC values close to full monolayer coverage. Yoshida et al. [63] also modified the films electrically by using a scanning probe microscope and reported significant increases in the conductivity of the films. The precursor

Surface assembly and nanofabrication of 1,1,1-tris(mercaptomethyl)heptadecane on Au(111) studied with time-lapse atomic force microscopy

• Tian Tian,
• Burapol Singhana,
• Lauren E. Englade-Franklin,
• Xianglin Zhai,
• T. Randall Lee and
• Jayne C. Garno

Beilstein J. Nanotechnol. 2014, 5, 26–35, doi:10.3762/bjnano.5.3

• scanning probe microscope (Agilent Technologies, Chandler, AZ) equipped with PicoView v1.8 software was used for the AFM characterizations and scanning probe lithography. Images were acquired using contact mode in a liquid cell, which can hold up to 1 mL of solution. Imaging and fabrication were